介质性能参数
|
CC4
(NPO,COG)
|
CT4
(X7R) |
CT4
(Y5V,Z5U)
|
容量范围 |
0.5pF~104 |
221~225 |
103~106 |
容量误差 |
B=±0.1pF |
C=±0.25pF |
K=±10% |
M=±20% |
D=±0.5pF |
F=±1% |
M=±20% |
S=+50%~-20% |
G=±2% |
J=±5% |
S=+50%~-20% |
Z=+80%~-20% |
K=±10% |
M=±20% |
|
P=+100%~0 |
B,C,D for C <10pF |
|
|
额定电压 |
25V, 50V, 100V, 200V, 500V, 1000V
2000V,3000V, 4000V |
25V, 50V, 100V
200V, 250V |
损耗(DF) |
0.15%Max |
2.5%Max |
5.0%Max |
(20℃,1MHZ,1VDC) |
(20℃,1KHZ,1VDC) |
(20℃,1KHZ,0.3VDC) |
绝缘电阻 |
C≤10nF |
IR≥10000MΩ |
C≤25nF |
IR≥4000MΩ |
C>10nF |
IR>500Ω.F |
C>25nF |
C×R>100ΩF |
介质耐压强度 |
测试时无明显损伤 |
端电极结合强度 |
测试时无明显损伤 |
弯曲强度 |
测试时无明显损伤。
容量误差不超过10% |
可焊性
|
时间: |
2±1s |
温度.: |
235±5℃ |
覆盖: |
≥ 95% |
耐焊接热
|
时间: |
5±1s |
温度.: |
265±5℃
|
覆盖: |
≥ 95% |
△C/C: |
≤0.5% or 0.5pF |
≤-5% ~ +10% |
≤-10% ~ +20% |
温度循环变化
|
△C/C: |
≤1% |
≤± 10% |
≤±30% |
外观: |
测试时无明显损伤 |
潮湿试验
|
△C/C: |
≤2% |
≤10% |
≤20% |
DF
|
0.003 |
0.05 |
0.07 |
IR |
R×C>25s |
外观: |
测试时无明显损伤 |
温度特性 (△C/C)
|
±30ppm/℃ |
±15% |
Z5U(E) |
+22~-56% |
Y5V(F) |
+22~-82% |
振动
|
外观: |
测试时无明显损伤 |
撞击
|
△C/C:
|
≤2% |
外观: |
测试时无明显损伤 |
寿命测试
(1000小时)
|
△C/C: |
≤2% |
≤±12.5% |
≤±30.0% |
DF |
0.003 |
0.05 |
IR |
R×C>25s |
R×C≥25s |
外观: |
测试时无明显损伤 |
介质性能参数
|
CC41
|
CT41
|
|
(NP0)(C0G)
|
(X7R)
|
(X5R)
|
(Y5Y)
|
(Z5U)
|
容量范围 |
0R5-104
|
181-225
|
153-107
|
103-226
|
682-275
|
温度系数 |
0±30ppm/℃
(-55℃—+125℃) |
±15%
(-55℃—+125℃) |
±15%
(-55℃—+85℃) |
+30%—-80%
(-25℃—+85℃) |
+22%—-56%
(+10℃—+85℃) |
绝缘电阻 |
1000MΩ-μF 或100GΩ (100,000MΩ) |
1000MΩ-μF 或100GΩ (100,000MΩ) |
100MΩ-μF或10G(≥16V)50MΩ-μF或10G(≤16V)(10,000MΩ) |
1000MΩ-μF 或 100GΩ(10,000MΩ) |
介质强度 |
施加300%额定电压,1-5秒.充放电电流限制到50mA(最大)
注意:额定电压500V的产品施加150%额定电压 |
施加300%额定电压,1-5秒.充放电电流限制到50mA(最大)
|
施加300%额定电压,1-5秒.充放电电流限制到50mA(最大)
注意:额定电压500V的产品施加150%额定电压 |
损耗 (tgδ) |
≤0.1%
1.0MHz C≤102
1.0KHz C>102 |
≥50V ≤2.5%
25V ≤3.5%
16V ≤3.5%
≤10V ≤5.0%
C<106 1.0KHz 1.0Vrms
C>106 20Hz 0.5Vrms
|
≥50V ≤2.5%
25V ≤5.0%
16V C≤564 ≤5.0% C>564≤10.0%
C≤106 1.0KHz 1.0Vrms
C>106 120Hz 0.5Vrms |
≥50V ≤5.0%
25V ≤7.0%
16V ≤9.0%
≤10V ≤12.5%
C≤106 1.0KHz 1.0Vrms
C>106 120Hz 0.5Vrms |
100V ≤4.0%
50V ≤4.0%
25V ≤4.0%
C≤106 1.0KHz 1.0Vrms
C>106 120Hz 0.5Vrms |
量误差 |
B=±0.1pF <10pF
C=±0.25pF<10pF
D=±0.50pF<10pF
F=±1%≥10pF
G=±2%≥10pF
J=±5%
K=±10% |
J=±5%
K=±10%
M=±20%
|
K=±10%
M=±20%
|
M=±20%
Z=-20—+80%
|
M=±20%
Z=-20—+80% |
可焊性 |
EIA-198,方法301(245℃,5秒,Sn62焊料)在端头95%表面光滑 |
耐焊接热 |
EIA-198,方法302,条件B( 260℃,10秒)未滤去镍隔离层 |
负载寿命 |
EIA-198,方法201,1000小时,额定电压的200%,+125℃(X5R、Z5U和Y5V为+85℃)。(电气参数结果见下表) |
热冲击 |
EIA-1988,方法202,条件B。第一步:-55℃(30±3分钟);第二步:室温(≤3分钟);第三步:+125℃(X7R、Y5V、Z5U为85℃)(30±3分钟);第四步:室温(≤3分钟)。重复5次,在室温存放24±2小时后测试(电气参数:容量变化C0G:≤±2.5%或±0.25pF,取大者;X7R、X5R:≤±7.5%;Y5V、Z5U:≤±20%;其余参数满足初始值。) |
潮热试验 |
EIA-198,方法206。储存在85℃±2℃、相对湿度85%±5%1000小时(+48,0)施加额定电压。从试验箱取出后在室温下稳定24±2小时再测试(电气参数结果见下表) |
附表:独石电容器环境试验极限值
材料
|
额定电压
(V)
|
初始
tgδ
(%)
|
IR
(GΩ或ΩF)
取小者
|
寿命/潮热试验后的tgδ(%)
|
寿命/潮热试验后
容量偏移值(%或pF)
取大者
|
寿命/潮热试验后
IR值(GΩ或ΩF)
取小者
|
C0G
|
100 |
0.1 |
100/1000 |
0.5 |
0.3%或±0.25pF |
10/100 |
50 |
0.1 |
100/1000 |
0.5 |
0.3%或±0.25pF |
10/100 |
25 |
0.1 |
100/1000 |
0.5 |
0.3%或±0.25pF |
10/100 |
16 |
0.1 |
100/1000 |
0.5 |
0.3%或±0.25pF |
10/100 |
X7R
|
100 |
2.5 |
100/1000 |
3.0 |
±20% |
10/100 |
50 |
2.5 |
100/1000 |
3.0 |
±20% |
10/100 |
25 |
3.5 |
100/1000 |
5.0 |
±20% |
10/100 |
16 |
3.5 |
100/1000 |
5.0 |
±20% |
10/100 |
6.3/10 |
5.0 |
100/1000 |
7.5 |
±20% |
10/100 |
X5R
|
50 |
205 |
100/1000 |
3.0 |
±20% |
10/100 |
25 |
5 |
100/1000 |
7.5 |
±20% |
10/100 |
<25 |
C≤564 |
5 |
100/1000 |
7.5 |
±20% |
10/100 |
C>564 |
10 |
100/1000 |
12.0 |
±20% |
10/100 |
Z5U
|
100 |
4.0 |
10/100 |
5.0 |
±30% |
1/10
|
50 |
4.0 |
10/100 |
5.0 |
±30% |
1/10
|
25 |
4.0 |
10/100 |
7.5 |
±30% |
1/10
|
Y5V
|
100 |
5.0 |
10/100 |
7.5
|
±30%
|
1/10
|
50 |
5.0 |
10/100 |
7.5 |
±30% |
1/10
|
25 |
7.0 |
10/100 |
10.0 |
±30% |
1/10
|
16 |
9.0 |
10/100 |
10.0 |
±30% |
1/10
|
6.3/10 |
12.5 |
10/50 |
15.0 |
±30% |
1/5
|
介质性能参数
|
CC42
(NPO) |
CT42
(X7R) |
CT42
(Y5V, Z5U) |
容量范围
|
OR5
to 472 |
331
to 224 |
103
to 125 |
温度系数 |
0±30PPm/℃
0±60PPm/℃ |
(-55
to +125) |
±15% (-55℃
to 125℃) |
+30%~80% (-25℃
to 85℃)
+22%~56% (+10℃
to 85℃) |
绝缘电阻 |
C
≤10nF
R ≥ 10000MΩ |
C
≤25nF
R ≥ 4000MΩ |
C
>10nF
C. R ≥ 100S |
C
>25nF
C. R ≥ 100S |
耐压 |
2.5
× W V D C |
|
损耗 |
0.15%max
(20℃, 1MHZ, 1VDC) |
2.5%max
(20℃, 1kHZ, 1VDC) |
5.0%max
(20℃, 1kHZ, 0.3VDC) |
额定电压 |
25,
50, 63, 100VDC |
25,
50, 63VDC |
容量误差 |
B=±0.1PF |
C=±0.25PF |
|
|
D=±0.5PF |
F=±1% |
K=±10% |
M=±20%
|
M=±20% |
S= |
+50 |
% |
G=±2% |
J=±5% |
S= |
+50 |
% |
Z= |
+80 |
% |
-20 |
K=±10% |
M=±20% |
-20 |
-20 |
|
寿命试验 |
200%额定电压在+125℃1000h |
150%额定电压在+85℃1000h |
可焊性
|
SJ/10211-91
4.11 |
SJ/T10211-91
4.11 |
耐焊接热 |
SJ/T10211-91
4.10 |
SJ/T10211-91
4.10 |
机械冲击 |
SJ/T10211-91
4.9 |
SJ/T10211-91
4.9 |
温度循环变化 |
SJ/T10211-91
4.12 |
SJ/T10211-91
4.12 |
稳态潮热 |
SJ/T10211-91
4.14 |
SJ/T10211-91
4.14 |
端电极结合强度 |
SJ/T10211-91
4.9 |
SJ/T10211-91
4.9 |
环境测试 |
SJ/T10211-91
4.13 |
SJ/T10211-91
4.13 |
|